学术报告---A Quad-Slope 70V GaN Gate Driver with Integrated Three-Mode Level Shifter for Enhanced Negative Voltage Tolerance, dV/dt Detection and Double-Edge Self-Triggered Delay Compensation

  

青年创新促进会青年论坛(第215期)

报告题目:A Quad-Slope 70V GaN Gate Driver with Integrated Three-Mode Level Shifter for Enhanced Negative Voltage Tolerance, dV/dt Detection and Double-Edge Self-Triggered Delay Compensation

报 告 人:刘天奇 高级工程师,莱特葳芯半导体(无锡)有限公司

报告时间:202517日(星期二)15:00开始

报告地点:近代物理研究所兰州南昌路园区工艺楼4楼会议室