学术报告---A Quad-Slope 70V GaN Gate Driver with Integrated Three-Mode Level Shifter for Enhanced Negative Voltage Tolerance, dV/dt Detection and Double-Edge Self-Triggered Delay Compensation
青年创新促进会“青年论坛”(第215期)
报告题目:A Quad-Slope 70V GaN Gate Driver with Integrated Three-Mode Level Shifter for Enhanced Negative Voltage Tolerance, dV/dt Detection and Double-Edge Self-Triggered Delay Compensation
报 告 人:刘天奇 高级工程师,莱特葳芯半导体(无锡)有限公司
报告时间:2025年1月7日(星期二)15:00开始
报告地点:近代物理研究所兰州南昌路园区工艺楼4楼会议室
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